Chemistry: analytical and immunological testing – Silicon containing
Patent
1993-12-13
1995-06-27
Czaja, Donald E.
Chemistry: analytical and immunological testing
Silicon containing
436 75, 436 79, 436 80, 420578, 423348, C01B 33037
Patent
active
054279526
ABSTRACT:
The present invention is a method for analyzing silicon for nonmetallic contaminants. The method comprises: (A) forming an alloy comprising silicon and a metal which promotes separation of nonmetallic contaminants present in the alloy, (B) separating the nonmetallic contaminants from the alloy, and (C) analyzing the separated nonmetallic contaminants for chemical content. The present invention is particularly useful for analyzing metallurgical grade silicon intended for use in the direct process for the production of organohalosilanes for the presence of oxides and carbides of calcium, aluminum, and silicon.
REFERENCES:
patent: 2380995 (1945-08-01), Rochow
patent: 2380996 (1945-08-01), Rochow
patent: 3372993 (1968-03-01), Brown
patent: 4151264 (1979-04-01), Mori et al.
patent: 4246249 (1989-01-01), Dawless
patent: 4256717 (1981-03-01), Dawless
patent: 4298423 (1981-11-01), Lindmayer
patent: 4312846 (1982-01-01), Dawless
patent: 4388286 (1983-01-01), Kapur et al.
patent: 4752327 (1988-06-01), Lee et al.
patent: 4822585 (1989-04-01), Dawless
Clark, J., Organometallic Chemistry, 376:165-222 (1989).
Daugherty Richard D.
Halm Roland L.
Kuivila Charles S.
Boley William F.
Cano Milton I.
Czaja Donald E.
Dow Corning Corporation
LandOfFree
Analytical method for nonmetallic contaminates in silicon does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Analytical method for nonmetallic contaminates in silicon, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Analytical method for nonmetallic contaminates in silicon will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-286800