Analytical mesh preparation apparatus, analytical mesh...

Details Analytical mesh preparation apparatus, analytical mesh... Analytical mesh preparation apparatus, analytical mesh...

2005-04-19

2005-04-19

Nghiem, Michael (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system

Orientation or position

Reexamination Certificate

active

06882954

ABSTRACT:
An analytical mesh preparation apparatus, an analytical mesh preparation method and an analytical mesh preparation program are provided which are capable of preparing a mesh in such a manner as to improve calculation accuracy and shorten the calculation time as well. Upon preparation of an analytical mesh by arranging grid lines in an analytical area to analyze prescribed physical quantities for an object composed of a plurality of parts, grid lines are first arranged at corners of the parts, and the intervals between adjacent ones of the grid lines are calculated. Based on the calculation result, the grid lines to be removed are determined, as a result of which the grid lines thus determined are removed. The shapes or sizes of the parts are changed in accordance with the removal of the grid lines.

REFERENCES:
patent: 20030052875 (2003-03-01), Salomie
patent: 0 881 585 (1998-12-01), None
patent: 10-334276 (1998-12-01), None
patent: 2001-099748 (2001-04-01), None

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