Analytical instrument optical element support system

Details Analytical instrument optical element support system Analytical instrument optical element support system

1983-03-03

1986-03-04

Willis, Davis L.

Optics: measuring and testing

By particle light scattering

With photocell detection

248487, 350634, G01B 902

Patent

active

045737940

ABSTRACT:
A system for supporting and spatially orienting an optical element within an analytical instrument, the instrument being of the type having a source of analytical radiation and optical elements for directing the radiation through the instrument. A planar base is secured within the instrument while a support plate carries an optical element to be supported within the instrument. A member spaces one support plate portion from the base while allowing a spatial reorientation of the support plate around the spaced support plate portion. First and second point contact systems adjustably space different support plate portions from the base. The support plate is resiliently biased toward the base with the adjustable point contacts establishing the spacial orientation of the support plate, and thus the optical element, relative to the base. In a preferred embodiment, a spherical pivot spaces the one support plate portion from the base while cooperating cylindrical and conical members establish the first and second point contacts for support plate reorientation. This system also prevents rotation of the support plate relative to the base.

REFERENCES:
patent: 3601476 (1971-08-01), Mackenzie
patent: 3897139 (1975-07-01), Caruolo et al.
patent: 4053231 (1977-10-01), Fletcher et al.
patent: 4088396 (1978-05-01), Edelstein
patent: 4278324 (1981-07-01), Zipfel
patent: 4293112 (1981-10-01), Horton

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