Analytical instrument for measurement of isotopes at low...

Details Analytical instrument for measurement of isotopes at low... Analytical instrument for measurement of isotopes at low...

2005-03-22

2005-03-22

Lee, John R. (Department: 2881)

Radiant energy

Ionic separation or analysis

C250S282000, C250S288000

Reexamination Certificate

active

06870153

ABSTRACT:
An inductively coupled plasma source mass spectrometer is equipped with a multidimensional detector system wherein ions transmitted by the mass spectrometer are detected.

REFERENCES:
patent: 4686366 (1987-08-01), Stuke
patent: 4734579 (1988-03-01), Lucatorto et al.
patent: 5068534 (1991-11-01), Bradshaw et al.
patent: 5313067 (1994-05-01), Houk et al.
patent: 5471059 (1995-11-01), Freedman et al.
patent: 5640010 (1997-06-01), Twerenbold
patent: 5679950 (1997-10-01), Baba et al.
patent: 5872629 (1999-02-01), Colvard
patent: 6028308 (2000-02-01), Hager
patent: 6184982 (2001-02-01), Karanassios
patent: 0611169 (1994-02-01), None
patent: 2176649 (1986-12-01), None
patent: 2219432 (1989-12-01), None
patent: 2267994 (1993-12-01), None
patent: 2273200 (1994-06-01), None
patent: 2288273 (1995-10-01), None
Kellner et al., Analytical Chemistry, © 1998, pp. 827-828.
UK Patent Office Search Report for priority application, dated Mar. 29, 1999.

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