Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1989-08-24
1990-11-13
Eisenzopf, Reinhard J.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324686, 7386424, 422 67, 422100, 422106, G01R 2726, G01N 3502, B01L 302
Patent
active
049704680
ABSTRACT:
Analytical equipment, in which liquid substances in sample containers and reagent containers are delivered to reaction cells by a vertically movable probe. The sample containers and the reagent containers are supported on a rotatable metal plate. The metal plate is rotated to place one of the sample containers or reagent containers at a sample or reagent pipetting position. The probe transmits a high-frequency signal to detect a change in electrostatic capacitance between itself and the metal plate at a time the probe is put in contact with a liquid substance in the sample or reagent container. A spline shaft for moving the probe in a vertical direction has a detection plate, and a control signal is generated when the detection plate reaches a predetermined position. The generation of the high-frequency signal is stopped when the probe begins to make a descending motion until the control signal is generated, to reduce the adverse effect of disturbing waves on various parts.
REFERENCES:
patent: 3635094 (1972-01-01), Oberli
patent: 4228831 (1980-10-01), Kerns
patent: 4326851 (1982-04-01), Bello et al.
patent: 4736638 (1988-04-01), Okawa et al.
patent: 4818492 (1989-04-01), Shimizu
patent: 4897244 (1990-01-01), Wallace et al.
Hashimoto Hiroshi
Ishizawa Masato
Eisenzopf Reinhard J.
Harvey Jack B.
Hitachi , Ltd.
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