Analytical element and measuring device and substrate...

Details Analytical element and measuring device and substrate... Analytical element and measuring device and substrate...

2005-04-12

2005-04-12

Noguerola, Alex (Department: 1753)

Electrolysis: processes, compositions used therein, and methods

Electrolytic analysis or testing

Involving enzyme or micro-organism

C204S403140, C600S345000, C600S347000

Reexamination Certificate

active

06878262

ABSTRACT:
The present invention provides an analytical element which is free from evaporation of a sample during measurement and therefore capable of quantifying a substrate using a very small amount of sample with high accuracy and which is free from scattering of the sample during and after the measurement and therefore hygienically excellent; and a measuring device and a substrate quantification method using the same. The analytical element comprises a cavity for accommodating a sample, a working electrode and a counter electrode exposed to an inside of the cavity, a reagent layer which comprises at least an oxidoreductase and is formed inside or in the vicinity of the cavity, an opening communicating with the cavity and a member covering the opening.

REFERENCES:
patent: 5714123 (1998-02-01), Sohrab
patent: 6488828 (2002-12-01), Bhullar et al.
patent: 6699382 (2004-03-01), Yoshioka et al.
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JPO computer translation of Satoshi et al. (JP 07-159366).*
JPO computer translation of Tadahisa (JP 09-285459).

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