Optics: measuring and testing – By dispersed light spectroscopy – With raman type light scattering
Reexamination Certificate
2006-03-10
2008-12-16
Lauchman, L. G (Department: 2877)
Optics: measuring and testing
By dispersed light spectroscopy
With raman type light scattering
C977S762000
Reexamination Certificate
active
07466406
ABSTRACT:
The present invention relates to methods of detecting analytes using nanowires having nanodisk arrays. In particular, the present invention discloses methods of detecting analytes via surface enhanced Raman scattering (SERS) and employing nanowires prepared using on-wire lithography (OWL).
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Huang Ling
Mirkin Chad A.
Park Sung-ho
Qin Lidong
Xue Can
Lauchman L. G
Marshall & Gerstein & Borun LLP
Northwestern University
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