Analysis of elemental composition and thickness in...

X-ray or gamma ray systems or devices – Specific application – Fluorescence

Reexamination Certificate

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Reexamination Certificate

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11538652

ABSTRACT:
A method and computer program software product for establishing an areal density of an elemental constituent of one layer of a stack of layers of material overlying a substrate. Incident penetrating radiation excites characteristic x-ray fluorescent radiation in multiple lines associated with each of one or more elements. Areal densities of successive layers are determined by self-consistent solution of equations relating the ratios of intensities of the characteristic fluorescence lines of successive elements.

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Ida et al., “Analysis of wrapped or cased object by a hand-held X-ray fluorescence spectrometer”, Forensic Science International, Elsevier Scientific Publishers Ireland Ltd, IE, vol. 151, No. 2-3, pp. 267-272, Jul. 16, 2005.
Cesareo et al., “Giotto in the Chapel of the Scrovegni: EDXRF analysis of the golden haloes with portable equipment”, X-Ray Spectrometry, vol. 33, pp. 289-293, 2004.

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