Image analysis – Applications – Manufacturing or product inspection
Patent
1997-07-16
2000-09-12
Boudreau, Leo H.
Image analysis
Applications
Manufacturing or product inspection
382151, 382294, G06K 952, G06T 300
Patent
active
06118893&
ABSTRACT:
An image of an actual pattern of discrete objects is analyzed with respect to a model representing a predefined ideal pattern of objects. Initial processing is performed on only a portion of the image associated with ones of the objects located in an original neighborhood within the image to determine information about an affine transformation of the actual pattern of the discrete objects relative to the predefined ideal pattern. Additional processing is performed on other portions of the image based on the results of the initial processing. Initial processing is performed with respect to a first part of the image by operating on only a first portion of all of the digital data that represents that first part of the image. Later additional processing is performed with respect to another part of the image by operating on only a second portion of all of the digital data that represents that other part of the image, the second portion being relatively smaller than the first portion so that the additional processing is less intensive than the initial processing.
REFERENCES:
patent: 4803735 (1989-02-01), Nishida et al.
patent: 5067162 (1991-11-01), Driscoll, Jr. et al.
patent: 5465152 (1995-11-01), Bilodeau et al.
patent: 5550763 (1996-08-01), Michael et al.
patent: 5574668 (1996-11-01), Beaty
patent: 5652658 (1997-07-01), Jackson et al.
patent: 5694482 (1997-12-01), Maali et al.
patent: 5870489 (1999-02-01), Yamazaki et al.
Caracappa, "On Improving BGA Reliability and Quality", Surface Mount Technology, Jun. 1997, pp. 44-46.
"ICOS Component Checker For BGA Inspection" specification sheets; "ICOS 2-Dimensional BGA Inspection System" specification sheets, ICOS Vision Systems, Apr. 3, 1996.
"Normalized Correlation Coefficient", R.A. Hoggenboom, Apr. 17, 1996,/http://www.wi.leidenuniv.nl./.about.rhoogenb
ode26.html, 2 pages.
"Affine Transformations", University of Waterloo/http://www.undergrat.math.unwaterloo.ca/.about.cs488/ln.HTML/Affi nenode.html, 3 pages.
Deley et al., "Accurate Placement of Ball Grid Array Packages," reprinted from Electronic Packaging & Production, Apr. 1996, Cahners Publishing Company, Newton, MA, USA.
Hager, William W., "Chapter 6 Eigenproblems, Section 6-11 The Singular Value Decomposition and the Pseudoinverse," Applied Numerical Linear Algebra, 1988, pp. 294-303, Prentice Hall, Englewood Cliffs, NJ, USA.
Thomas, Jr., George B., "Chapter 14 Partial Differentiation," Calculus and Analytic Geometry, 1953, pp. 481-532, Addison-Wesley Publishing Company, Inc., Cambridge, MA, USA.
Cognex Corporation, Chapter 7 Mathematics, Coordinate Transformation by Pseudoinverse, Cognex 3000/4000/5000 System Software, 1996, pp. 204-210, Revision 7.4 590-0134, Natick, MA.
Cognex Corporation, "Chapter 1 Searching, Correlation Searching," Cognex 300/4000/5000 Vision Tools, 1996, pp.17-25, Revision 7.4 590-0136, Natick MA.
Cognex Corporation, "Chapter 11 Ball Grid Array Device Inspection," SMD Placement Guidance Product User's Manual, 1996, pp. 213-246, Release 2.3.00 590-1039, Natick MA.
Ballard, D.H., "Generalizing the Hough Transform to Detect Arbitrary Shapes*," Pattern Recognition, 1981, pp. 111-122, vol. 13, No. 2, Pergamon Press Ltd., UK.
Grimson et al., "On the Sensitivity of the Hough Transform for Object Recognition," IEEE Transactions on Pattern Analysis and Machine Intelligence, Mar. 1990, pp. 255-274, vol. 12. No. 3.
Strang, Gilbert, "Chapter 3 Orthogonal Projections and Least Squares, Section 3.4 The Pseudoinverse and the Singular Value Decomposition," Linear Algebra and Its Applications, Second Edition, 1980, Academic Press, Inc., New York, NY USA.
Silver et al., "Practical Golden Template Comparison," Cognex Corporation, Jun. 6, 1990, pp. 2-11, Needham, MA, USA.
"RVSI Vanguard Products," http://www.vai.net/products/products./htm, pp. 1-2, Jun. 3, 1998.
"RVSI Vanguard VAi 5020," http://www.vai.net/products/prod01.htm3 pp. 1-4, Aug. 3, 1998.
"RVSI Vanguard VAi 5200/VAi 5300," http://www.vai.net/products/prod02.htm, pp. 1-4, Jul. 30, 1998.
"RSVI Vanguard VAi 6300," http://www.vai.net/products/6300.htm3 pp. 1-5, Oct. 14,1998.
Boudreau Leo H.
Calabresi Tracy M.
Cognex Corporation
Miele Anthony L.
Weinzimmer Russ
LandOfFree
Analysis of an image of a pattern of discrete objects does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Analysis of an image of a pattern of discrete objects, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Analysis of an image of a pattern of discrete objects will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-103394