Analysis module, integrated circuit, system and method for...

Details Analysis module, integrated circuit, system and method for... Analysis module, integrated circuit, system and method for...

2006-12-19

2006-12-19

Hollington, Jermele (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010, C324S073100, C702S117000

Reexamination Certificate

active

07151387

ABSTRACT:
A system (5) for testing and failure analysis of an integrated circuit (10) is provided using failure analysis tools (40, 50, 60). An analysis module (30) having a number of submodule test structures is incorporated into the integrated circuit design. The test structures are chosen in dependence upon the failure analysis tools (40, 50, 60) to be used. The rest of the integrated circuit contains function modules (20) arranged to provide normal operating functions. By analysing the submodule test structures of the analysis module (30) using the failure analysis tools (40, 50, 60), physical parameters of the integrated circuit (10) are obtained and used in subsequent testing of the function modules (20) by the failure analysis tools (40, 50, 60), thus simplifying the testing of the integrated circuit (10) and reducing the time taken to perform a failure analysis procedure.

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