Optics: eye examining – vision testing and correcting – Eye examining or testing instrument – Objective type
Patent
1991-09-17
1993-05-18
Bovernick, Rodney B.
Optics: eye examining, vision testing and correcting
Eye examining or testing instrument
Objective type
351246, A61B 310
Patent
active
052125068
ABSTRACT:
Flicks in one or both of eyes are measured by a sensor (1) employing a limbus reflection method. An output of the sensor is applied to and digitized by an A/D converter (2). The digitized output is applied to a computer (3). The computer calculates flicks data of eyeballs, then calculates fractal dimension simultaneously or individually in a time-elapsed manner or for a definite time period, and quantifies characteristics of the eyeball control systems from the value of the fractal dimension or the time dependence of the fractal dimension.
REFERENCES:
patent: 4973149 (1990-11-01), Hutchinson
patent: 5002384 (1991-03-01), Trachtman
Mitsuho Yamada et al., "Defining of Gazing Point for Picture Analysis and Its Applications", Systems and Computers in Japan, vol. 18, No. 8, 1987, pp. 88-96 (no month avail.).
Thomas C. Halsey et al., "Fractal Measures and their Singularities: The Characterization of Strange Sets", Physical Review A (The American Physical Society), vol. 33, No. 2, Feb. 1986, pp. 1141-1151.
David M. Drouin et al., "A Fiber Optic Eye Position Sensor", Proceedings of the 13th Annual Northeast Bioengineering Conference, vol. 1, Mar. 12, 1987, pp. 181-184.
Yamada Mitsuho
Yoshimatsu Hiroshi
ATR Auditory and Visual Perception Research Laboratories
Bovernick Rodney B.
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