Analysis method and analysis apparatus

Radiant energy – Ionic separation or analysis

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C250S282000

Reexamination Certificate

active

07923680

ABSTRACT:
An analysis apparatus includes a first process part for removing a film formed on a substrate by irradiating the film with ultraviolet light, a second process part for providing a solution onto a surface of the substrate for dissolving an object being analyzed on the substrate, and a third process part for analyzing the object being analyzed in the solution that is used in the second step.

REFERENCES:
patent: 5426057 (1995-06-01), Tamaoki
patent: 5633172 (1997-05-01), Shimazaki
patent: 6037270 (2000-03-01), Kageyama et al.
patent: 2003/0073240 (2003-04-01), Mizuno
patent: 4 164251 (1992-06-01), None
patent: 6 283582 (1994-10-01), None
patent: 7 161791 (1995-06-01), None
patent: 8 237709 (1996-09-01), None
patent: 2001 208743 (2001-08-01), None
patent: 2006 32859 (2006-02-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Analysis method and analysis apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Analysis method and analysis apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Analysis method and analysis apparatus will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2719011

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.