Analysis apparatus

Details Analysis apparatus Analysis apparatus

2008-05-13

2008-05-13

Mariam, Daniel (Department: 2624)

Image analysis

Pattern recognition

Feature extraction

C382S203000

Reexamination Certificate

active

07372995

ABSTRACT:
An analysis apparatus includes an information acquisition part for acquiring shape information about an analysis target object, an additional information extraction part for extracting additional information on the analysis target object from the shape information, and an analysis condition decision part for determining at least one boundary conditions based on the additional information.

REFERENCES:
patent: 4183013 (1980-01-01), Agrawala et al.
patent: 4771469 (1988-09-01), Wittenburg
patent: 5154795 (1992-10-01), Ishida et al.
patent: 5835379 (1998-11-01), Nakano
patent: 5946220 (1999-08-01), Lemelson
patent: 5983251 (1999-11-01), Martens et al.
patent: 6956961 (2005-10-01), Cong et al.
patent: 7246049 (2007-07-01), Nakanishi et al.
patent: 2002/0183993 (2002-12-01), Hirata
patent: 2004/0049722 (2004-03-01), Matsushita
patent: 2002-140653 (2002-05-01), None

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