Geometrical instruments – Gauge – Movable contact probe – per se
Patent
1993-03-19
1995-02-21
Will, Thomas B.
Geometrical instruments
Gauge
Movable contact probe, per se
33558, 33707, G01B 520
Patent
active
053904249
ABSTRACT:
An analogue probe has a fixed structure and a stylus supporting member connected to the fixed structure by three serially mounted pairs of leaf springs interconnected by first and second intermediate members. The stylus supporting member supports an elongate stem upon which a cube, which supports three scales, is mounted. Readheads are mounted on the fixed structure, in register with the scales, to transduce movement of the stylus supporting member in three substantially orthogonal directions. The alignment of the scales about the yaw axis (extending in a direction perpendicular to the plane of the scale) determines the alignment of the measuring axes of the probe, while the straightness of the lines of the scales determines the straightness of the axes.
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Butter Andrew G.
McMurtry David R.
Powley David G.
Welsford Adrian C.
Renishaw Metrology Limited
Will Thomas B.
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