Coded data generation or conversion – Analog to or from digital conversion – With particular solid state devices
Reexamination Certificate
2001-08-30
2003-06-17
JeanPierre, Peguy (Department: 2819)
Coded data generation or conversion
Analog to or from digital conversion
With particular solid state devices
C341S159000
Reexamination Certificate
active
06580381
ABSTRACT:
BACKGROUND OF THE INVENTION
1. Field of the Invention
The present invention relates to analog-to-digital converters having a first reference potential source for providing first reference potentials, a first input stage having at least two differential amplifiers. Each of the differential amplifiers have a first and second transistor, a first input for feeding in one of the reference potentials, a second input for feeding in a first input signal, and two output terminals.
2. Description of the Related Art
An analog-to-digital converter (A/D converter) of this type is disclosed for example in Hui Pan et al.: “A3.3V 12b 50Msample/s A/D Converter in 0.6 &mgr;m CMOS with over 80 dB SFDR”, paper MP 2.4, Proceedings of the International Solid State Circuit Conference ISSCC 2000.
FIG. 1
illustrates an input stage of such an A/D converter according to the prior art.
This A/D converter has as reference potential source, a series circuit of resistors R
11
, R
12
, R
13
, R
14
, R
15
which are connected up between a supply potential Vdd and a reference-ground potential GND. In this case, different reference potentials VRP
1
, VRP
2
, VRP
3
, VRP
4
can be tapped off in each case at nodes between two adjacent resistors. These reference potentials VRP
1
, VRP
2
, VRP
3
, VRP
4
are fed to respective first inputs of identically constructed differential amplifiers DV
11
, DV
12
, DV
13
, DV
14
, a first input signal VIP being fed to second inputs of these differential amplifiers DV
11
, . . . , DV
14
. The differential amplifiers DV
11
, . . . , DV
14
each have first and second transistors T
11
, T
12
, the gate terminal of the first transistor T
11
being connected to a first input terminal E
11
of the differential amplifier and the gate terminal of the second transistor T
12
being connected to a second input terminal E
12
. Source terminals of the first and second transistors of the differential amplifier DV
11
, . . . , DV
14
are connected to a common current source I
11
. The drain terminals of the first and second transistors T
11
, T
12
form output terminals A
11
, A
12
of the differential amplifiers DV
11
, . . . , DV
14
, these output terminals A
11
, A
12
being connected to a second supply potential V+ via resistors RL
1
, RL
2
, for example. By means of comparators (not specifically illustrated), the potentials at the two output terminals A
11
, A
12
of a differential amplifier are evaluated, and the first input signal VIP is compared with all the reference potentials VRP
1
, . . . , VRP
4
in this way.
The A/D converter known according to the prior art and illustrated in
FIG. 1
has a second input stage in addition to the first input stage. This second input stage has a series circuit of resistors R
21
, R
22
, R
23
, R
24
, which are connected up between the supply potential Vdd and the reference-ground potential GND. In this case, reference potentials VRM
1
, VRM
2
, VRM
3
, VRM
4
can be tapped off at nodes between the resistors R
21
, . . . , R
24
and are fed to respective first inputs of differential amplifiers DV
21
, DV
22
, DV
23
, DV
24
. These differential amplifiers DV
21
, . . . , DV
24
are identical to one another and identical to the differential amplifiers DV
11
, . . . , DV
14
of the first input stage. A second input signal VIM, which corresponds to the difference between a constant signal and the input signal VIP, is fed to the second input terminal of the differential amplifiers DV
21
, . . . , DV
24
of the second input stage. A differential amplifier of the first input stage and a differential amplifier of the second input stage in each case form a differential amplifier pair, in which the first output A
11
of a differential amplifier DV
11
of the first input stage is connected to the second output A
22
of a differential amplifier DV
21
of the second input stage and a second output A
12
of a differential amplifier DV
11
of the first input stage is connected to a first output A
21
of a differential amplifier DV
21
of the second input stage. In this case, the common outputs M
1
, P
1
are connected to the second supply potential V+ via resistors RL
1
, RL
2
. The reference potentials VRM
1
, . . . , VRM
4
fed to the differential amplifiers DV
21
, . . . , DV
24
of the second input stage correspond to the difference between the first supply potential Vdd and the supply potential VRP
1
, VRP
2
, VRP
3
, VRP
4
of the associated differential amplifier DV
11
, . . . , DV
14
of the first input stage. This combination of two differential amplifiers to form a differential amplifier pair, complementary input signals VIP, VIM and complementary reference potentials VRP
1
, . . . , VRP
4
, VRM
1
, . . . , VRM
4
in each case being fed to the individual differential amplifiers of a differential amplifier pair, increases the common-mode rejection of such an A/D converter according to the prior art.
In order to be able to operate the transistors of the differential amplifiers in the known A/D converter in the saturation region, a minimum gate potential is required for driving them, which results from the sum of the saturation voltage of the current source, the threshold voltage, that is to say the gate-source voltage at which the transistors start to conduct, and an effective gate voltage. When the transistors are realized as n-channel MOS transistors and the current sources are also realized as MOS transistors using silicon technology, typical values are 0.15 V for the saturation voltage of the current source, 0.3 V for the threshold voltage and 0.15 V for the required effective gate voltage, with the result that the gate potential at the transistors must be a minimum of 0.6 V in order to be able to operate the transistors of the differential amplifiers in the saturation region. In other words, the respective smallest reference potential (VRP
1
, VRM
4
in
FIG. 1
) must be at least 0.6 V. If a supply voltage of 1.2 V is assumed for an entire circuit arrangement in which the A/D converter is realized, and if account is taken of the fact that driver stages for providing the input voltage VIP, VIM usually fall short by at least 0.2 V in attaining the supply voltage of 1.2 V, with the result that the maximum input voltage is only about 1.0 V, then a usable input voltage range remains within which the input signal VIP is permitted to fluctuate by only 0.4 V, which corresponds to one third of the supply voltage. Such a small input voltage range is not sufficient for many applications.
SUMMARY OF THE INVENTION
It is an aim of the present invention, therefore, to provide an analog-to-digital converter in which the processable voltage range of the input signal is increased compared with previously known analog-to-digital converters.
This aim is achieved with an A/D converter wherein first and second transistors of at least one of the differential amplifiers are of a type complementary to the first and second transistors of the other differential amplifiers.
Accordingly, the A/D converter according to the invention has a first reference potential source for providing first reference potentials, and a first input stage having at least two differential amplifiers, which each have a first and a second transistor. According to the invention, the first and second transistors of at least one differential amplifier are of a type complementary to the first and second transistors of the other differential amplifiers, in other words the first and second transistors of at least one differential amplifier are designed as p-channel transistors, while the first and second transistors of the other differential amplifiers are designed as n-channel transistors.
The advantage of using differential amplifiers having p-channel transistors and differential amplifiers having n-channel transistors in an A/D converter consists in the possibility of also being able to process input signals which lie below the minimum gate potential for n-channel transistors.
REFERENCES:
patent: 4752766 (1988-06-01), Shimizu et al.
patent: 5416484 (1995-05-01), Lofstrom
patent: 5774086 (1
Greenberg Laurence A.
Infineon - Technologies AG
Jean-Pierre Peguy
Lauture Joseph J
Locher Ralph E.
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