Coded data generation or conversion – Analog to or from digital conversion – Analog to digital conversion
Reexamination Certificate
2011-04-19
2011-04-19
Lauture, Joseph (Department: 2819)
Coded data generation or conversion
Analog to or from digital conversion
Analog to digital conversion
C341S155000
Reexamination Certificate
active
07928889
ABSTRACT:
An analog-to-digital converter receives first and second analog signal voltages, and first and second comparison voltages. The first and second comparison voltages decrease by the same fixed inclination from a first reference voltage to below the first signal voltage and from a second reference voltage to below the second signal voltage, respectively. The converter counts cumulatively over first periods to acquire a first result, counts cumulatively over second periods to acquire a second result, and outputs a difference between the first and second results as a digital quantity. Each first period is time required for the first comparison voltage to change from the first reference voltage to the same voltage as the first signal voltage. Each second period is time required for the second comparison voltage to change from the second reference voltage to the same voltage as the second signal voltage.
REFERENCES:
patent: 6906648 (2005-06-01), Koike
U.S. Appl. No. 12/834,270, filed Jul. 12, 2010, Sakurai, et al.
Woodward Yang et al., “An Integrated 800×600 CMOS Imaging System”, ISSCC99/Session 17/Paper WA 17.3, ISSCC Digest of Technical Papers, Feb. 1999, 3 pages.
Kabushiki Kaisha Toshiba
Lauture Joseph
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
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