Analog-to-digital converter, solid-state imaging device...

Coded data generation or conversion – Analog to or from digital conversion – Analog to digital conversion

Reexamination Certificate

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C341S155000

Reexamination Certificate

active

07928889

ABSTRACT:
An analog-to-digital converter receives first and second analog signal voltages, and first and second comparison voltages. The first and second comparison voltages decrease by the same fixed inclination from a first reference voltage to below the first signal voltage and from a second reference voltage to below the second signal voltage, respectively. The converter counts cumulatively over first periods to acquire a first result, counts cumulatively over second periods to acquire a second result, and outputs a difference between the first and second results as a digital quantity. Each first period is time required for the first comparison voltage to change from the first reference voltage to the same voltage as the first signal voltage. Each second period is time required for the second comparison voltage to change from the second reference voltage to the same voltage as the second signal voltage.

REFERENCES:
patent: 6906648 (2005-06-01), Koike
U.S. Appl. No. 12/834,270, filed Jul. 12, 2010, Sakurai, et al.
Woodward Yang et al., “An Integrated 800×600 CMOS Imaging System”, ISSCC99/Session 17/Paper WA 17.3, ISSCC Digest of Technical Papers, Feb. 1999, 3 pages.

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