Analog-to-digital converter capable of performing self-test

Details Analog-to-digital converter capable of performing self-test Analog-to-digital converter capable of performing self-test

2007-01-02

2007-01-02

Barnie, Rexford (Department: 2819)

Coded data generation or conversion

Analog to or from digital conversion

Analog to digital conversion

C341S155000

Reexamination Certificate

active

11306257

ABSTRACT:
While transforming an analog input voltage into a digital signal including several bits, an analog-to-digital converter including a built-in self test (BIST) circuit is used for performing the transformation and compensating an offset error of the analog input voltage. The operations of the digital-to-analog converter include a self test mode and a normal mode. And each of the self test mode and the normal mode includes a sampling phase and a bit cycling phase.

REFERENCES:
patent: 7038609 (2006-05-01), Hurrell
patent: 2003/0098808 (2003-05-01), Hirai
patent: 2006/0066464 (2006-03-01), San et al.

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