Coded data generation or conversion – Converter calibration or testing
Reexamination Certificate
2008-11-13
2010-11-30
Nguyen, Linh V (Department: 2819)
Coded data generation or conversion
Converter calibration or testing
C341S118000, C341S119000, C341S121000, C341S151000, C455S126000, C455S127200, C455S232100, C455S246100
Reexamination Certificate
active
07843369
ABSTRACT:
In a wireless transmitter and receiver, a background calibration type analog-to-digital converter generally occupies a large area because of the phase compensating capacity of an op-amp included in a reference analog-to-digital conversion unit. Further, the calibration type analog-to-digital converter generally requires a sample and hold circuit to exclude influence of parasitic capacitance of wirings, thereby increasing power consumption. Digital calibration is performed by using, as a signal for calibration, an input signal of a digital-to-analog converter in a transmitter circuit of the wireless transmitter and receiver and inputting an output signal from the digital-to-analog converter to the analog-to-digital converter in the receiver circuit.
REFERENCES:
patent: 5701600 (1997-12-01), Wetters et al.
patent: 6819910 (2004-11-01), Shi et al.
patent: 7110469 (2006-09-01), Shi et al.
patent: 7203466 (2007-04-01), Muschallik et al.
patent: 7366478 (2008-04-01), Kerth et al.
patent: 7463864 (2008-12-01), Vassiliou et al.
patent: 7539268 (2009-05-01), Fechtel
patent: 7567611 (2009-07-01), Chien
patent: 7567788 (2009-07-01), Newton et al.
patent: 7672645 (2010-03-01), Kilpatrick et al.
patent: 2007/0207760 (2007-09-01), Kavadias et al.
patent: 2004-242028 (2004-08-01), None
Y. Chiu et al. “Least Mean Square Adaptive Digital Background Calibration of Pipelined Analog-to-Digital Converters”, IEEE Transactions on Circuits and Systems I, vol. 51, pp. 38-46 (2004).
Takashi Oshima et al., “Fast Digital Background Calibration for Pipelined Type A/D Converters”, The Institute of Electronics, Information and Communication Engineers, Technical Report of IEICE VLD 2006-138, ICD1006-229, pp. 115-120 (2007).
Andrew N. Karanicolas et al., “A 15-b 1-Msample/s Digitally Self-Calibrated Pipeline ADC”, IEEE Journal of Solid-State Circuits, vol. 28, No. 12, pp. 1207-1215, Dec. 1993.
B. Hernes et al. , “A 92.5mW 205MS/s 10b Pipeline IF ADC Implemented in 1.2V/3/3V 0.13μm CMOS”, Nordic Semiconductor, Trondheim, Norway, 2007 IEEE International Solid-State Circuits Conference, Session 25.6, pp. 462-463 and 615, Feb. 2007.
C. Grace et al., “A 12b 80MS/s Pipelined ADC with Bootstrapped Digital Calibration”, 2004 IEEE International Solid-State Circuits Conference, Session 25.5, Feb. 2004.
Oshima Takashi
Takahashi Tomomi
Yamawaki Taizo
Hitachi , Ltd.
Miles & Stockbridge P.C.
Nguyen Linh V
LandOfFree
Analog-to-digital converter and communication device and... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Analog-to-digital converter and communication device and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Analog-to-digital converter and communication device and... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4203507