Analog test cell circuit

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

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324763, G01R 3128

Patent

active

057449490

ABSTRACT:
An electrical circuit with test capability includes an analog signal path for carrying an analog signal, first and second nodes for use in testing the analog signal path, a first switching element connected to the first node, a second switching element connected to the second node, and a third switching element connected between the analog signal path and the first and second switching elements, whereby first and second test signal paths are respectively provided between the analog signal path and the first and second nodes.

REFERENCES:
patent: 4970454 (1990-11-01), Stambaugh et al.
patent: 5225834 (1993-07-01), Imai
patent: 5260950 (1993-11-01), Simpson
patent: 5404358 (1995-04-01), Russell
John Novellino, "Standards Group Making Progress On Mixed-Signal Test Bus Standard", Electronic Design, May 27, 1993, p. 35.
IEEE P 1149.4 "Mixed-Signal Test Bus Standards Newsletter", Summer 1993, 3 pages (month unavailable).
"Proposed p1149.4 Analog Voltage Comparison Output", Wm. H. Smith, Minutes of p1149.4 Mixed-Signal Test Bus. Standard, Jun. 1993, Dallas, Texas.
"Proposed p1149.4 Analog Transfer Gate Output Multiplexor", Wm. H. Smith, Minutes of p1149.4 Mixed-Signal Test Bus. Standard, Jun. 1993, Dallas, Texas.
"A Proposed, p1149, Simple Analog Only Test Access", Wm. H. Smith, Minutes of p1149.4 Mixed-Signal Test Bus. Standard, Jun. 1993, Dallas, Texas.
Motorola Document MC54/74HC4051, High-Speed CMOS Logic Data, DL129, Rev 4, Mar. 1989, pp. 2-31 thru 2-34, 5-468 thru 5-479.
Motorola Document MC68HC11A8/D -1988 pp. 7-1 thru 7-5, pp. 9-6 thru 9-7 pp. 1-2 thru 1-3.

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