Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Circuit simulation
Reexamination Certificate
2006-05-16
2006-05-16
Shah, Kamini (Department: 2128)
Data processing: structural design, modeling, simulation, and em
Simulating electronic device or electrical system
Circuit simulation
C703S003000, C703S004000, C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
07047173
ABSTRACT:
A method for modeling analog signals that may comprise (A) detecting one or more attributed analog signals and (B) modeling the attributed analog signals by adding a signature to each of the one or more attributed analog signals.
REFERENCES:
Sassan Tabatabaei and Andre Ivanov, “A Current Integrator for BIST of Mixed-Signals IC's” dated 1999, Proc. of VLSI Test Symposium.
Sassan Tabatabaei and Andre Ivanov, “A Built-in Current Monitor for Testing Analog Circuit Blocks”,□□Apr. 1999 VLSI Test Symposium Proceedings. 17th IEEE, Apr. 25-29, 1999, pp.: 311-318□□.
Franc Novak, Bojan Hvala, and Sandi Klavzar, “On Analog Signature Analysis”, Mar. 1999, Design Automation and test in Europe Conference and Exhibition 1999 Proceedings, p. 249-253.
Chen-Yang Pan and Kwang-Ting (Tim) Cheng, “Pseudorandom Testing for Mixed-Signal Circuits” 1997.
Linda S. Milor, “A tutorial Introduction to Research on Analog and Mixed-Signal Circuit Testing”, Oct. 1998, IEEE Transactions on Circuits and Systems—II.
M. Renovell, F. Azais and Y. Bertrand, “On-Chip Analog Output Response Compaction”, Mar. 17-20, 1997 , European Design and Test Conference, 1997. ED&TC 97. Proceedings , pp.: 568-572□□.
Larky Steven P.
Little Terry D.
Christopher P. Maiorana PC
Cypress Semiconductor Corp.
Day Herng-der
Shah Kamini
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