Analog multi-channel probe system

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

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Details

3241581, 371 225, G01R 3128

Patent

active

054184703

ABSTRACT:
A programmable analog multi-channel probe system is embedded within a device under test for coupling test points to external measurement points of the device under test. Programmable input buffer amplifiers are coupled to the test points to couple the data at those points to their outputs when enabled. The data from the input buffer amplifiers are input to respective routers to provide a plurality of outputs. Each common output from the routers is coupled as an input to an output buffer amplifier that provides the data as an output when enabled. The data at the output of the output buffer amplifiers is converted to a differential signal for transmission to the external measurement point by differential input/output amplifiers that have a reference level, selected from a plurality of reference levels including an internal reference level, as an input for comparison with the data from the output buffer amplifiers. A termination circuit may be provided for each output to provide appropriate impedance interface with the measurement points.

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patent: 5315241 (1994-05-01), Ewers

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