Excavating
Patent
1995-06-05
1996-04-09
Voeltz, Emanuel T.
Excavating
371 226, 3241581, G01R 313167
Patent
active
055068510
ABSTRACT:
In an analog-digital mixed master for a Bi-CMOS analog/digital mixed LSI, an analog circuit and a digital circuit are interconnected through selectors, which are also connected to test terminals and which are controlled by test mode terminals. By changing the signals applied to the test mode terminals, the analog circuit and the digital circuit are interconnected through the selectors, or the analog circuit is connected through the selectors to the test terminals, or the digital circuit is connected through the selectors to the test terminals. Thus, the analog circuit and the digital circuit can be tested independently of each other.
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Fasang et al., "Design For Testability For Mixed Analog/Digital ASIC's", IEEE 1988 Custom IC Conf., May 1988, pp. 16.5.1-16.5.4.
NEC Corporation
Stamber Eric W.
Voeltz Emanuel T.
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