Analog computing method of solving a second order differential e

Details Analog computing method of solving a second order differential e Analog computing method of solving a second order differential e

1985-09-24

1988-03-29

Harkcom, Gary V.

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364807, G06G 718

Patent

active

047348798

ABSTRACT:
A method of measuring the depletion layer width and electric field of a semiconductor junction or barrier with a particular impurity distribution profile in the semiconductor. With analog computation technique, a time-varying signal is used to simulate the impurity profile. Automatic generation of the constants of integration for the solution of Poisson's differential equation is achieved by adjusting pulse repetition rate or by iterative bisection method.

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patent: 4074113 (1978-02-01), Gabriel
patent: 4471451 (1984-09-01), Schenck

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