Analog and mixed signal device tester

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...

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324623, 324626, 324 7612, 324 7711, G01R 2026

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active

057449694

ABSTRACT:
Analog and mixed signal integrated circuits are tested using the modified Volterra series to model the integrated circuit being tested. An adaptive algorithm, for example, least mean square or Kalman, is used to determine to coefficients of the Volterra series. The coefficients are then used to calculate the THD and SNR.

REFERENCES:
patent: 3567872 (1971-03-01), Naryanan
patent: 4669116 (1987-05-01), Agazzi
patent: 4993047 (1991-02-01), Moffatt
Tutorial DSP-Based Testing of Analog and Mixed-Signal Circuits Matthew Mahoney, IEEE Catalog Number Eh0258-4, pp. 61-111 Mar. 1987.
Adaptive Filter Theory, Simon Haykin, McMaster University, Prentice Hall, Englewood Cliffs, New Jersey 07632, Apr. 1986.
EDN, Jun. 1989, Chirp-z Transform Efficiently Computes Frequency Spectrum, T. Lyon.
IEEE Trans. of Circuits and Systems, Jul. 1987, Fundemental Relations between the LMS Algorithm and the DFT, B. Widrow.
IEEE Trans. on Automatic Control, Jul. 1965, A Consideration of the Discrete Volterra Series, P. Alper.
THD and SNR Tests Using the Simplified Volterra Series with Adaptive Algorithms, Luke S. L. Hsieh and Andrew Grochowski, AT&T Bell Laboratories, Allentown, PA, Jun. 1995.
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences, vol. E78-A, No. 1, Jan. 1995.

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