Analog and analytical computation method for determining detecto

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364524, 3561245, G01M 1100

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active

050758837

ABSTRACT:
An analog computer method provides modulation transfer functions (MTF) expressions or graphs for arbitrary shaped detectors in an arbitrary scan direction. Fraunhofer diffraction calculations or measurements given for specific shaped apertures are used for calculating detector MTFs of similarly shaped detectors. In an analog measuring device, an aperture in an opaque screen may be made the shape of a detector whose MTF is to be calculated. The aperture is flooded with laser light which produces a Fraunhofer irradiance pattern at an observing screen which is parallel with the opaque screen, for measuring the irradiance in the Fraunhofer plane at the observing screen. A sensor, which has a detector small compared with the diffraction pattern, is moved along the chosen thermal imager scan direction, in the Fraunhofer plane. The analog pattern of the irradiance along the x'-axis is digitized by a digitizer, has the square root of the irradiance versus distance along the x'-axis plotted and normalized so that at x'=0 the square root of the irradiance equals one (1). By relabeling the square root of the irradiance with MTF and relabeling the x'-axis with spatial frequency a detector MTF curve is shown in appropriate units of spatial frequency.

REFERENCES:
patent: 3549240 (1970-12-01), Sawatari
patent: 3938892 (1976-07-01), Klingman, III
"Measurment of Two-Dimensional Optical System Modulation Transfer Function MTF) by Computation of Second Order Speckle Statistics", Lund & Azuit SPIE, vol. 192 Interferometry 1979, pp. 166-173.

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