Anadization system with remote voltage sensing and active feedba

Chemistry: electrical and wave energy – Processes and products

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

204345, 204 561, 20412925, 2041293, 204228, 204237, 20412975, 204252, 204266, 204406, C25D 1132/21/12

Patent

active

048911038

ABSTRACT:
The disclosure relates to a process station to precisely control the electrochemical anodization of specially prepared silicon substrates. Remotely placed voltage probes are utilized to monitor changes in the potential drop across the wafer as the anodization proceeds. As the available anodilizable area changes, the voltage drop across the wafer and hence the anodization current density is maintained at the desired value by the computer through the use of active feedback provided by these probes. Any desired anodization conditions can be programmed into the system using the system software, thereby adding an even greater degree of control over the process.

REFERENCES:
patent: 2686279 (1954-08-01), Barton
patent: 3010885 (1961-11-01), Schink
patent: 3634213 (1972-01-01), Coates
patent: 3798139 (1974-03-01), Schwartz
patent: 4133724 (1979-01-01), Hartnagel et al.
patent: 4166782 (1979-09-01), Collins et al.
patent: 4628591 (1986-12-01), Zorinsky et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Anadization system with remote voltage sensing and active feedba does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Anadization system with remote voltage sensing and active feedba, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Anadization system with remote voltage sensing and active feedba will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1382007

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.