An interferometric measuring system having temperature compensat

Details An interferometric measuring system having temperature compensat An interferometric measuring system having temperature compensat

1995-01-13

1996-07-16

Gonzalez, Frank

Optics: measuring and testing

By particle light scattering

With photocell detection

356351, 356358, G01B 902, G01B 1102

Patent

active

055372090

ABSTRACT:
An improved interferometric measuring system wherein the system projects a first beam of light at a first measurement wavelength along a reference path to a reference reflector and a second beam of light at a second measurement wavelength along a measurement path to a measurement reflector, and determines a change in position of the measurement reflector from an interference pattern produced between a first light beam reflected from the reference reflector and a second light beam reflected from the measurement reflector, and wherein the system can measure atmospheric disturbances along the measurement path, concurrently with measuring a change in the position of the measurement reflector.

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