Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified electrical sensor or system
Patent
1989-11-16
1991-01-15
Raevis, Robert
Measuring and testing
Specimen stress or strain, or testing by stress or strain...
Specified electrical sensor or system
G01L 100
Patent
active
049844695
ABSTRACT:
An apparatus for providing an indication of the amplitude of a length signal having a top peak, a bottom peak and an intrinsic offset and being indicative of viscoelasticity of a sample. A peak measurement circuit is provided for measuring values of top and bottom peaks of the length signal to determine the amplitude thereof and an offset circuit is connected for providing a compensative offset. An adder circuit is provided for adding the compensative offset to the length signal. An offset calculation circuit receptive of the values of the top and bottom peaks from the peak measurement circuit is provided for outputting to the offset circuit, according to the received values, a control signal effective to control the offset circuit to provide an update compensative offset effective to cancel the intrinsic offset of the length signal.
REFERENCES:
patent: 3477286 (1969-11-01), Baker
patent: 3712125 (1973-01-01), Meyer
patent: 4145933 (1979-03-01), Imig et al.
patent: 4414852 (1983-11-01), McNeill
Nakamura Nobutaka
Take Masafumi
Takeda Haruo
Raevis Robert
Seiko Instruments Inc.
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