Amplifiers – With amplifier condition indicating or testing means
Reexamination Certificate
1999-12-16
2001-10-30
Shingleton, Michael B (Department: 2817)
Amplifiers
With amplifier condition indicating or testing means
C341S126000, C330S009000, C327S554000
Reexamination Certificate
active
06310514
ABSTRACT:
BACKGROUND
The invention generally relates to an amplifier that indicates its degree of calibration, such as an amplifier that is used in a stage of a pipelined analog-to-digital converter, for example.
An analog-to-digital converter (ADC) typically is used to form an interface between a computer and its surroundings. As an example, a sensor, such as a microphone, may generate an analog signal that indicates sounds that are sensed by the microphone, and the computer may process or store indications of the sounds. However, because the computer typically processes digital data, an ADC may be used to convert the analog signal into a digital signal, a representation that is recognized by the computer.
An ADC is effectively a collection of analog devices that are fabricated on the same semiconductor die along with digital devices. Unfortunately, the fabrication process may be tailored to optimize performance of the digital devices. As a result, the fabrication process may not permit precise fabrication of sensitive analog devices of the ADC, a constraint that may compromise the accuracy of the ADC.
For example, referring to
FIG. 1
, one type of ADC is a pipelined ADC
10
, a circuit that converts an analog input signal (called V
IN
) into a digital signal by using a successive approximation technique to produce bits of the digital signal. More particularly, the ADC
10
may be formed from N pipelined stages
12
(stages
12
1
,
12
2
and
12
N
, as examples), each of which indicates one bit of an N bit digital signal. The ADC
10
produces the bits of the digital signal one stage
12
at a time, beginning with the most significant bit (that appears at the output terminal of the stage
12
1
) and continuing in an ordered sequence along the pipeline to eventually produce the least significant bit (that appears at the output terminal of the stage
12
N
) when the conversion is complete. To begin the conversion, the stage
12
1
, (that is associated with the most significant bit) receives the V
IN
analog input signal, and a comparator
14
(of the stage
12
1
) compares the V
IN
analog input signal to a reference analog signal (called V
REF
), a comparison that produces an indication of the most significant bit at the comparator's output terminal, a terminal that forms the output terminal of the stage
12
1
. The V
IN
analog input signal passes through an amplifier
16
that multiplies the V
IN
analog input signal by two, a bit order adjustment in preparation for the comparison by the lower bit order stage
12
2
. The output signal of the amplifier
16
, in turn, is received by an adder
18
(of the stage
12
1
) that adds either the V
REF
analog reference signal or a −V
REF
analog reference signal to the output signal of the amplifier
16
to produce a signal (at the output terminal of the adder
18
) depending on the output of comparator
14
.
In this manner, when the comparator determines that V
IN
is greater than V
REF
, V
REF
is subtracted from the amplifier
16
output. Similarly, when V
IN
is less than V
REF
, V
REF
is added to the amplifier
16
output. This output of the adder
18
signal is known as the residue and is received by an input terminal of a comparator
14
of the stage
12
2
that, along with the other stages
12
, function similarly to the stage
12
1
, to produce the other bits of the digital signal.
The gain (ideally two) of the amplifier
16
contributes significantly to the overall accuracy of the ADC
10
. The offset error may be corrected by other architectural changes not disclosed here so the gain become the dominant error contributor. The amplifier
16
may be, for example, a switched capacitor amplifier that uses a ratio of capacitances to establish its gain. Unfortunately, the digital process that may be used to fabricate the capacitors of the amplifier
16
may not permit the formation of capacitors that have precise capacitances. As a result, the actual gain of the amplifier
16
may be substantially different from the ideal gain of two, and thus, the inaccuracy that is introduced by the amplifier
16
may limit the overall accuracy of the ADC
10
.
Thus, there is a continuing need for an arrangement that addresses one or more of the problems that are stated above.
SUMMARY
In an embodiment of the invention, an amplifier includes a first circuit and a second circuit. The first circuit, in a first mode of the amplifier, amplifies an input signal to produce a first output signal. The second circuit is coupled to the first circuit to cause the first circuit to, in a second mode of the amplifier, provide a second output signal that is indicative of a degree of calibration of the amplifier.
Advantages and other features of the invention will become apparent from the following description, drawing and claims.
REFERENCES:
patent: 5805019 (1998-09-01), Shin
patent: 6011433 (2000-01-01), Nairn
Intel Corporation
Shingleton Michael B
Trop Pruner & Hu P.C.
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