Amorphous semiconductor devices having increased switching speed

Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons

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307256, 307460, 307479, 307480, 307317R, 357 2, 357 4, H03K 1704, H03K 1908

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active

045889031

ABSTRACT:
A high speed digital electronic system includes a plurality of logic or switching circuits for providing one or more bits of discrete output in response to applied input signals. At least some of the circuits include devices switchable between at least two logic states, and are formed from materials of the type which exhibit increased switching speeds when maintained in a dynamic mode of operation. Signal source means apply to the system dynamic signals for maintaining the switchable devices in a dynamic mode of operation. The switchable devices are preferably formed from amorphous semiconductor alloys including silicon and may take the form of diodes to form AC logic AND gates, OR gates or a matrix selection circuit. The dynamic signals take the form of alternating major and minor clock pulses having a frequency between 10 and 40 megahertz. The logic circuits are arranged to form a binary adder.

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patent: 4485389 (1984-11-01), Ovshinsky et al.
patent: 4499557 (1985-02-01), Holmberg et al.
Fritzsche, "Physics of Instabilities in Amorphous Semiconductors", IBM J. Res. Develop., Sep. 1969, pp. 515-521.
Vogel et al, "Negative Capacitance in Amorphous Semiconductor Chalcogenide Thin Films", Applied Physics Letters, vol. 14, No. 7, Apr. 1969, pp. 216-218.
M. Matsumura, et al., "Switching Characteristics of Amorphous-Silicon Field-Effect-Transistors", Japanese Journal of Applied Physics, vol. 20, pp. L414-L416 (Jun. 1981).

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