Aluminum cladding thickness measurement probe and instrument hav

Details Aluminum cladding thickness measurement probe and instrument hav Aluminum cladding thickness measurement probe and instrument hav

1983-09-08

1986-01-14

Strecker, Gerard R.

Electricity: measuring and testing

Magnetic

With means to create magnetic field to test material

324202, 324236, G01B 710, G01R 3312, G01R 3500, G01N 2772

Patent

active

045648107

ABSTRACT:
A system for measuring the cladding thickness on aluminum sheets which includes a cylindrical probe holder with four evenly spaced contact points surrounding a low temperature coefficient torroidal ferrite core which provides a signal to an aluminum cladding thickness signal processing circuit comprising a crystal oscillator, low drift detector, and push button calibration instrument portion thereby enabling drift free repeatable measurements.

REFERENCES:
patent: 2933677 (1960-04-01), Lieber
patent: 3495196 (1970-02-01), Lorenzi et al.
patent: 4247818 (1981-01-01), Hiroshima et al.

Affiliated with

Also associated with

Rating

Aluminum cladding thickness measurement probe and instrument hav does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Aluminum cladding thickness measurement probe and instrument hav, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Aluminum cladding thickness measurement probe and instrument hav will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-432239