Semiconductor device manufacturing: process – Making device array and selectively interconnecting
Reexamination Certificate
2006-03-14
2006-03-14
Lebentritt, Michael (Department: 2812)
Semiconductor device manufacturing: process
Making device array and selectively interconnecting
C438S662000, C438S663000
Reexamination Certificate
active
07011990
ABSTRACT:
An alloying method includes the steps of forming a metal layer on a semiconductor having been transferred to a material having a low thermal conductivity, and alloying an interface between the semiconductor and the metal layer by irradiating the interface with a laser beam having a wavelength absorbable in at least one of the semiconductor and the metal layer. The irradiation energy of the laser beam is set in a range of 20 to 100 mJ/cm2. The material having a low thermal conductivity is a resin or amorphous silicon. According to the alloying method using laser irradiation, since the entire semiconductor is not heated and only a necessary portion is locally heated, the necessary portion can be readily alloyed to be converted into an ohmic contact without exerting adverse effect on characteristics of the semiconductor device. In the case of previously transferring a semiconductor to a material having a low thermal conductivity, for example, into a resin, and irradiating an interface between the semiconductor and an electrode with a laser beam, the interface between the semiconductor and the electrode can be alloyed at a low temperature, to lower the irradiation energy of the laser beam.
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Ohata Toyoharu
Tomoda Katsuhiro
Depke Robert J.
Isaac Stanetta
Lebentritt Michael
Trexler, Bushnell Giangiorgi, Blackstone & Marr, Ltd.
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