Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
Reexamination Certificate
2006-12-12
2009-08-11
Cosimano, Edward R (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Measured signal processing
C702S188000
Reexamination Certificate
active
07574327
ABSTRACT:
An all-in-one digital cantilever controller applicable to all SFM systems is disclosed that can perform many relevant experiments for cantilever control in scanned force microscopy. A compact optimized digital implementation replaces analog components associated with cantilever signal processing and control. It has minimal thermal drift, at least an order of magnitude less than analog components. It has a number of meaningful tuning parameters available, as well as a user-friendly graphical interface (GUI) for adjusting those tuning parameters and performing different types of experiments.
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de Roover Dirk
Emami-Naeini Abbas
Porter, II La Moyne L.
Cosimano Edward R
Glenn Michael A.
Glenn Patent Group
SC Solutions
Washburn Douglas N
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