Geometrical instruments – Gauge – Template
Patent
1997-12-12
2000-01-04
Fulton, Christopher W.
Geometrical instruments
Gauge
Template
33613, 422 8205, G01N 2100, G01B 314
Patent
active
060096322
ABSTRACT:
An analyte testing meter is provided with a template for facilitating assembly during the manufacturing process. The template aligns the electro-optics components on the printed circuit board and aligns the optics block containing light directing elements such as lenses, waveguides and beamsplitters with the electro-optics elements. Other alignment features are provided which improve precision of the assembled product and obviate the need for expensive alignment equipment.
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Doan Quyen
Fulton Christopher W.
Mercury Diagnostics Inc.
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