Optics: measuring and testing – Angle measuring or angular axial alignment – Star/sun/satellite position indication with photodetection
Reexamination Certificate
2008-06-03
2008-06-03
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
Angle measuring or angular axial alignment
Star/sun/satellite position indication with photodetection
C356S399000, C356S139030, C356S139040
Reexamination Certificate
active
07382448
ABSTRACT:
A method and apparatus is disclosed for aligning an optical instrument with respect to a celestial coordinate system, the optical instrument having a field of view and an optical instrument coordinate system, the celestial coordinate system having a plurality of objects each having celestial coordinates. The method includes the steps of receiving a plurality of captured optical instrument positions in the optical instrument coordinate system along with a plurality of associated capture times; calculating, for each associated capture time in the plurality of associated capture times, coordinates in the optical instrument coordinate system for the plurality of objects to create a plurality of calculated object positions for each associated capture time; and, determining, for each associated capture time, a match for each captured optical instrument position in the plurality of captured optical instrument positions with the plurality of calculated object positions to create a list of actual alignment objects.
REFERENCES:
patent: 3571567 (1971-03-01), Eckermann
patent: 4082462 (1978-04-01), Owen
patent: 4083636 (1978-04-01), Owen
patent: 4129278 (1978-12-01), Bressler
patent: 4281928 (1981-08-01), Brunson
patent: 4682091 (1987-07-01), Krewalk et al.
patent: 4709178 (1987-11-01), Burr
patent: 4764881 (1988-08-01), Gagnon
patent: 4790641 (1988-12-01), Halldorsson
patent: 4927252 (1990-05-01), Burr
patent: 5124844 (1992-06-01), Wraight
patent: 5177686 (1993-01-01), Boinghoff et al.
patent: 5347286 (1994-09-01), Babitch
patent: 5446465 (1995-08-01), Diefes et al.
patent: 5489142 (1996-02-01), Mathieu
patent: 5537250 (1996-07-01), Masunaga et al.
patent: 5555160 (1996-09-01), Tawara et al.
patent: 5574465 (1996-11-01), Okada
patent: 5600491 (1997-02-01), Hull et al.
patent: 5745869 (1998-04-01), van Bezooijen
patent: 5809457 (1998-09-01), Yee et al.
patent: 5822116 (1998-10-01), Leblanc
patent: 5828814 (1998-10-01), Cyman et al.
patent: 5907433 (1999-05-01), Voigt et al.
patent: D412920 (1999-08-01), Diebel et al.
patent: 5935195 (1999-08-01), Quine
patent: 5956177 (1999-09-01), Nishikata et al.
patent: 5983071 (1999-11-01), Gagnon et al.
patent: 6016120 (2000-01-01), McNabb et al.
patent: 6049306 (2000-04-01), Amarillas
patent: 6102338 (2000-08-01), Yoshikawa et al.
patent: 6108594 (2000-08-01), Didinsky et al.
patent: 6227496 (2001-05-01), Yoshikawa et al.
patent: 6289268 (2001-09-01), Didinsky et al.
patent: 6324475 (2001-11-01), Potteck
patent: 6330988 (2001-12-01), Liu et al.
patent: 6369942 (2002-04-01), Hedrick et al.
patent: 6392799 (2002-05-01), Baun et al.
patent: 6470270 (2002-10-01), Needelman et al.
patent: 6512979 (2003-01-01), Needelman et al.
patent: 6523786 (2003-02-01), Yoshikawa et al.
patent: 6603602 (2003-08-01), McWilliams
patent: 6671091 (2003-12-01), McWilliams
patent: 6766227 (2004-07-01), Needelman et al.
patent: 2003/0156324 (2003-08-01), Baun et al.
patent: 2003/0197930 (2003-10-01), Baun et al.
patent: 2004/0047036 (2004-03-01), Baun et al.
patent: 2004/0090673 (2004-05-01), McWilliams
patent: 2004/0233521 (2004-11-01), McWilliams
patent: WO 97/11882 (1997-04-01), None
patent: WO 00/25166 (2000-05-01), None
patent: WO 00/25167 (2000-05-01), None
patent: WO 00/25168 (2000-05-01), None
Hedrick Richard L.
Paquette Andre
Celestron Acquisition, LLC
Jeffer Mangels Butler & Marmaro LLP
Nur Abdullahi
Toatley , Jr. Gregory J.
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