Alignment structure

Geometrical instruments – Straight-line light ray type – Alignment device

Reexamination Certificate

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Details

C033SDIG021

Reexamination Certificate

active

07143520

ABSTRACT:
Two (or more) components must be aligned to each other in the pitch, roll, and azimuth axes. One component is adjustable relative to the other non-adjustable component. The pitch and roll angles are measured with a high accuracy digital protractor. The readings are taken from fixed reference points on the non-adjustable and the adjustable components, and the position of the adjusting component is modified until the pitch and roll of the adjusting component matches the pitch and roll of the non-adjusting component. The azimuth angle is measured by using two line generating lasers, one that produces a visible azimuth axis on the non-adjustable component and the other which produces the visible azimuth axis on the adjustable component. The separation of the two lines is measured such that one measurement is in close proximity to the laser generators and the other is at a distance from the laser generators. The measurements are then compared and the position of the adjustable component is adjusted as required to make the measurements the same. This allows for alignment in the azimuth axis to be achieved with rapid and high degree of accuracy with minimal training and equipment.

REFERENCES:
patent: 4624563 (1986-11-01), Johnson
patent: 4709485 (1987-12-01), Bowman
patent: 4712953 (1987-12-01), Witzel et al.
patent: 4764010 (1988-08-01), Bachmann et al.
patent: 4867560 (1989-09-01), Kunitsugu
patent: 4882772 (1989-11-01), Rist et al.
patent: 4928401 (1990-05-01), Murray, Jr.
patent: 4977516 (1990-12-01), Shepard
patent: 4981354 (1991-01-01), DeHainaut et al.
patent: 4984173 (1991-01-01), Imam et al.
patent: 4999506 (1991-03-01), Mizusawa et al.
patent: 5077905 (1992-01-01), Murray, Jr.
patent: 5115406 (1992-05-01), Zatezalo et al.
patent: 5148232 (1992-09-01), Duey et al.
patent: 5244052 (1993-09-01), Yamaguchi
patent: 5371953 (1994-12-01), Nower et al.
patent: 5430539 (1995-07-01), Lysen
patent: 5450245 (1995-09-01), Grotzinger et al.
patent: 5684578 (1997-11-01), Nower et al.
patent: 5715609 (1998-02-01), Nower
patent: 5877854 (1999-03-01), Shai et al.
patent: 6031613 (2000-02-01), Washington
patent: 6034763 (2000-03-01), Slater et al.
patent: 6046799 (2000-04-01), Lysen
patent: 6049378 (2000-04-01), Busch et al.
patent: 6049379 (2000-04-01), Lucas
patent: 6411375 (2002-06-01), Hinkle et al.
patent: 6889441 (2005-05-01), Seiffert
patent: 6915582 (2005-07-01), Engels
patent: 2005/0166411 (2005-08-01), Scorvo
patent: 2005/0237516 (2005-10-01), Lysen

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