Alignment method and parameter selection method

Optics: measuring and testing – By alignment in lateral direction – With registration indicia

Reexamination Certificate

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Reexamination Certificate

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11195836

ABSTRACT:
A method of aligning an object including steps of detecting an image of a mark on the object with respect to each of a plurality of areas on the object, obtaining a position of the mark based on the detected image with respect to each image detected in the detecting step, extracting a feature of the mark based on the detected image with respect to each image detected in the detecting step, determining a correction value based on previously prepared information to relate the extracted feature to the correction value, with respect to each position obtained in the obtaining step, correcting the obtained position based on the correction value with respect to each position obtained in the obtaining step, and calculating a position of each of a plurality of areas on the object based on positions corrected in the correcting step.

REFERENCES:
patent: 4531060 (1985-07-01), Suwa et al.
patent: 4702606 (1987-10-01), Matsuura et al.
patent: 4860374 (1989-08-01), Murakami et al.
patent: 4958082 (1990-09-01), Makinouchi et al.
patent: 5109430 (1992-04-01), Nishihara et al.
patent: 5260771 (1993-11-01), Komoriya et al.
patent: 5452090 (1995-09-01), Progler et al.
patent: 5493403 (1996-02-01), Nishi
patent: 5543921 (1996-08-01), Uzawa et al.
patent: 5594549 (1997-01-01), Mori et al.
patent: 6034378 (2000-03-01), Shiraishi
patent: 6101267 (2000-08-01), Shiraishi
patent: 6130751 (2000-10-01), Haginiwa et al.
patent: 6333786 (2001-12-01), Uzawa et al.
patent: 6567713 (2003-05-01), Lichtenstein et al.
patent: 6668075 (2003-12-01), Nakamura et al.
patent: 7038777 (2006-05-01), Kim et al.
patent: 7106444 (2006-09-01), Nakajima
patent: 63-232321 (1988-09-01), None
patent: 4-3413 (1992-01-01), None
patent: 5-335212 (1993-12-01), None

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