Alignment key, method for fabricating the alignment key, and...

Active solid-state devices (e.g. – transistors – solid-state diode – Alignment marks

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257SE23179

Reexamination Certificate

active

08004098

ABSTRACT:
An alignment key, a method for fabricating the alignment key, and a method for fabricating a thin film transistor substrate using the alignment key are provided. The alignment key includes a base substrate, a first alignment key and a first mark portion of a second alignment key, which are formed on the base substrate using a printing roll, a dielectric that is formed on the base substrate to cover the first alignment key, and a second mark portion of the second alignment key, which is formed on the dielectric and at least partly overlaps the first mark portion of the second alignment key.

REFERENCES:
patent: 5631111 (1997-05-01), Niu et al.
patent: 7569153 (2009-08-01), Baek et al.
patent: 2007/0298169 (2007-12-01), Kim et al.
patent: 2009/0231820 (2009-09-01), Tanaka

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Alignment key, method for fabricating the alignment key, and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Alignment key, method for fabricating the alignment key, and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Alignment key, method for fabricating the alignment key, and... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2788657

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.