Alignment adjuster of probe, measuring instrument and...

Optics: measuring and testing – By alignment in lateral direction

Reexamination Certificate

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C356S138000

Reexamination Certificate

active

07099008

ABSTRACT:
A probe alignment adjuster (10) for adjusting an angle of a probe (22) for measuring a configuration of a workpiece has an angle adjuster (21) capable of adjusting the angle of the probe so that the angle aligns with a reference axis line. Since the angle of the probe and a hole angle can be accurately coincided in measurement by coinciding the angle of the probe (22) and the reference axis line, interference with a sidewall caused in inserting into a deep hole can be avoided, thereby preventing damage on the probe.

REFERENCES:
patent: 3741555 (1973-06-01), Roesel
patent: 3826011 (1974-07-01), D'Aniello
patent: 3969926 (1976-07-01), Walker et al.
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patent: 4644274 (1987-02-01), Casarcia
patent: 4722336 (1988-02-01), Kim et al.
patent: 5806200 (1998-09-01), Brenner et al.
patent: 6014816 (2000-01-01), Matsumiya et al.
patent: 2002/0029128 (2002-03-01), Jones et al.
patent: 1 357 148 (1974-06-01), None
patent: 1 416 776 (1975-12-01), None
patent: 2 141 547 (1984-12-01), None
patent: S43-009792 (1968-04-01), None
patent: A 7-146130 (1995-06-01), None
patent: 11-211426 (1999-08-01), None
patent: A 2002-22433 (2002-01-01), None

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