Aligned nanostructures on a tip

Details Aligned nanostructures on a tip Aligned nanostructures on a tip

2011-03-29

2011-03-29

Vanore, David A (Department: 2881)

Scanning-probe techniques or apparatus; applications of scanning

General aspects of spm probes, their manufacture, or their...

Probe characteristics

C850S052000, C850S056000, C850S059000, C850S060000, C977S849000, C977S860000, C977S902000, C977S947000

Reexamination Certificate

active

07917966

ABSTRACT:
Techniques for fabricating carbon nanotubes aligned on a tip are provided. In one embodiment, a method for fabricating carbon nanotubes aligned on a tip includes forming nanostructures on the tip, and aligning the nanostructures on the tip using a fluid flowing on the tip.

REFERENCES:
patent: 4326989 (1982-04-01), Colon et al.
patent: 4498962 (1985-02-01), Oda et al.
patent: 5132002 (1992-07-01), Kato
patent: 6635311 (2003-10-01), Mirkin et al.
patent: 6743408 (2004-06-01), Lieber
patent: 7014749 (2006-03-01), Redepenning
patent: 7022541 (2006-04-01), Yenilmez et al.
patent: 7045947 (2006-05-01), Van Der Vaart et al.
patent: 2002/0046953 (2002-04-01), Lee et al.
patent: 2002/0182970 (2002-12-01), Liu et al.
patent: 2003/0157254 (2003-08-01), Mirkin et al.
patent: 2004/0173378 (2004-09-01), Zhou et al.
patent: 2005/0272885 (2005-12-01), Mirkin et al.
patent: 2007/0007142 (2007-01-01), Zhou et al.
patent: 2007/0014148 (2007-01-01), Zhou et al.
patent: 2007/0025907 (2007-02-01), Rezeq et al.
patent: 2007/0082459 (2007-04-01), Faris
patent: 2007/0221840 (2007-09-01), Cohen et al.
patent: 2008/0280137 (2008-11-01), Ajayan et al.
patent: 2009/0173931 (2009-07-01), Stumbo
patent: 2009/0272935 (2009-11-01), Hata et al.
patent: 2010/0068406 (2010-03-01), Man
patent: 1061041 (2000-12-01), None
patent: 2004211213 (2004-07-01), None
patent: WO 2005/025734 (2005-03-01), None
Stanislaus Wong, et al., Single-walled carbon nanotube probes for high-resolution nanonstructure imaging, Applied Physics Letters, vol. 73, No. 23, pp. 3465-3467, Dec. 7, 1998 American Institute of Physics.
Hongjie Dai, et al., Naontubes as nanoprobes in scanning probe microscopy, Nature, vol. 384, pp. 147-150, Nov. 14, 1996 Nature Publishing Group.
Ji-Eun Kim, et al., Use of dielectrophoresis in the fabrication of an atomic force microscope tip with a carbon nanotube: experimental investigation,Nanotechnology, vol. 17, pp. 2937-2941, 2006.
Jae-Hyeok Lee, et al., Fabrication of carbon nanotube AFM probes using the Langmuir-Blodgett technique,Ultramicroscopy, vol. 108, pp. 1163-1167, 2008.
Fa-Kuei Tung, et al., Hydrogen plasma enhanced alignment on CNT-STM tips grown by liquid catalyst-assisted microwave plasma-enhanced chemical vapor deposition,Applied Surface Science, vol. 254, pp. 7750-7754, 2008.
Office Action dated Jul. 22, 2010 received in U.S. Appl. No. 12/196,092, filed Aug. 21, 2008.
Hafner, et al., Catalytic growth of single-wall carbon nanotubes from metal particles, Chemical Physics Letters, 296, pp. 195-202, Oct. 30, 1998 Elsevier Science.
Heo, et al., Transmission-type Microfocus x-ray tube using carbon nanotube field emitters.App. Phys. Lett., 90:1-3, 2007.
Kong, et al., Chemical vapor deposition of methane for single-walled carbon nanontubes, Chemical Physics Letters 292, pp. 567-574, Aug. 14, 1998 Elsevier Science.
Sulchek, et al., “High-speed atomic force microscopy in liquid,”Rev. Sci. Instrum., vol. 71, No. 5, pp. 2097-2099, May 2000.
Yudasaka, et al., “Specific conditions for Ni catalyzed carbon nanotube growth by chemical vapor deposition,”Appl. Phys. Lett., vol. 67, No. 17, pp. 2477-2479, Oct. 23, 1995.
File History for U.S. Appl. No. 12/196,092, for the period of Aug. 21, 2008 to Jan. 24, 2008.

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