Image analysis – Pattern recognition
Reexamination Certificate
2007-02-27
2007-02-27
Chawan, Sheela (Department: 2624)
Image analysis
Pattern recognition
C382S103000, C382S254000, C348S222100
Reexamination Certificate
active
10196168
ABSTRACT:
A method and system for processing image data to identify characteristics of a captured scene. Image data corresponding to a captured scene is processed by processing algorithms to produce processed signals for use in identifying characteristics of the captured scene. A condition associated with the captured scene is determined. The processed signals are automatically selected as a function of the condition to produce a selected output. The selected output is used to identify characteristics of the captured scene.
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Buchanan & Ingersoll & Rooney PC
Chawan Sheela
Lockheed Martin Corporation
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