Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Reexamination Certificate
2011-05-17
2011-05-17
Chowdhury, Tarifur (Department: 2886)
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
Reexamination Certificate
active
07944559
ABSTRACT:
A hyperspectral imaging system has fore-optics including primary, secondary and tertiary fore-optics mirrors, and an imaging spectrometer including primary, secondary and tertiary spectrometer mirrors. Light from a distant object is collected by the primary fore-optics mirror, and the tertiary fore-optics mirror forms an intermediate object image at an entrance side of a spectrometer slit. The spectrometer mirrors are configured so that light from an exit side of the slit is diffracted by a grating on the secondary mirror, and an image representing spectral and spatial components of the object is formed by the tertiary spectrometer mirror on a focal plane array. The surface of each mirror of the fore-optics and the spectrometer has an associated axis of symmetry. The mirrors are aligned so that their associated axes coincide to define a common system axis, thus making the imaging system easier to assemble and align in relation to prior systems.
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X. Prieto-Blanco, et al., Analytical design of an Offner imaging spectrometer, Optics Express, v. 14, No. 20 (Oct. 2006) at pp. 9156-9168.
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Oskotsky Mark
Russo, Jr. Michael J.
BAE Systems Information and Electronic Systems Integration Inc.
Chowdhury Tarifur
Nur Abdullah
Zucker Leo
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