Metal working – Method of mechanical manufacture – Electrical device making
Reexamination Certificate
2006-07-04
2006-07-04
Arbes, Carl J. (Department: 3729)
Metal working
Method of mechanical manufacture
Electrical device making
C029S592100, C029S825000, C029S842000, C029S852000, C324S754090
Reexamination Certificate
active
07069638
ABSTRACT:
An electrical component testing device comprising a housing having at least one recess covered by a flexible membrane so as to form a chamber. A fluid passage extends through a portion of the housing and connects to the chamber thus permitting passage of a fluid material into the chamber. At least one contact member is positioned on the flexible membrane so as to provide an electrical connection to an electrical contact on a device to be tested.
REFERENCES:
patent: 3405361 (1968-10-01), Kattner et al.
patent: 4636723 (1987-01-01), Coffin
patent: 4649339 (1987-03-01), Grangroth et al.
patent: 4782289 (1988-11-01), Schwar et al.
patent: 4829241 (1989-05-01), Maelzer
patent: 4922192 (1990-05-01), Gross et al.
patent: 5001422 (1991-03-01), Dahlberg et al.
patent: 5012187 (1991-04-01), Littlebury
patent: 5014161 (1991-05-01), Lee et al.
patent: 5189363 (1993-02-01), Bregman et al.
patent: 5245277 (1993-09-01), Nguyen
patent: 5252916 (1993-10-01), Swart
patent: 5384531 (1995-01-01), Yamazaki et al.
patent: 5389885 (1995-02-01), Swart
patent: 5440231 (1995-08-01), Sugai
patent: 5485096 (1996-01-01), Aksu
patent: 5623214 (1997-04-01), Pasiecznik
patent: 5642054 (1997-06-01), Pasiecznik
patent: 5647756 (1997-07-01), Twigg et al.
patent: 5654127 (1997-08-01), Leedy
patent: 5656943 (1997-08-01), Montoya et al.
patent: 5788526 (1998-08-01), Twigg et al.
patent: 5831444 (1998-11-01), Pai
patent: 5977784 (1999-11-01), Pai
patent: 6005401 (1999-12-01), Nakata et al.
patent: 6028437 (2000-02-01), Potter
patent: 6033235 (2000-03-01), Ikeya
patent: 6259263 (2001-07-01), Lawrence et al.
patent: 6690184 (2004-02-01), Akram
patent: 6717422 (2004-04-01), Akram
patent: 6791171 (2004-09-01), Mok et al.
Arbes Carl J.
Knobbe Martens Olson & Bear LLP
Micro)n Technology, Inc.
LandOfFree
Air socket for testing integrated circuits does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Air socket for testing integrated circuits, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Air socket for testing integrated circuits will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3531742