Air bridge structures and methods of making and using air...

Details Air bridge structures and methods of making and using air... Air bridge structures and methods of making and using air...

2008-10-28

2010-06-01

Cosimano, Edward R (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C073S865900, C257SE21573, C324S500000, C324S537000, C324S754090, C702S001000, C702S108000, C702S127000

Reexamination Certificate

active

07729878

ABSTRACT:
A probe card assembly, according to some embodiments of the invention, can comprise a tester interface configured to make electrical connections with a test controller, a plurality of electrically conductive probes disposed to contact terminals of an electronic device to be tested, and a plurality of electrically conductive data paths connecting the tester interface and the probes. At least one of the data paths can comprise an air bridge structure trace comprising an electrically conductive trace spaced away from an electrically conductive plate by a plurality of pylons.

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