Air bridge structures and methods of making and using air...

Data processing: measuring – calibrating – or testing – Testing system

Reexamination Certificate

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Details

C257SE21573, C257SE23170, C257SE23169, C324S763010, C702S057000, C702S117000

Reexamination Certificate

active

07444253

ABSTRACT:
A probe card assembly, according to some embodiments of the invention, can comprise a tester interface configured to make electrical connections with a test controller, a plurality of electrically conductive probes disposed to contact terminals of an electronic device to be tested, and a plurality of electrically conductive data paths connecting the tester interface and the probes. At least one of the data paths can comprise an air bridge structure trace comprising an electrically conductive trace spaced away from an electrically conductive plate by a plurality of pylons.

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