Optics: measuring and testing – By light interference – Having light beams of different frequencies
Reexamination Certificate
2007-02-20
2007-02-20
Toetley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
By light interference
Having light beams of different frequencies
C356S477000
Reexamination Certificate
active
11009400
ABSTRACT:
An agile optical sensor based on spectrally agile heterodyne optical interferometric confocal microscopy implemented via an ultra-stable in-line acousto-optic tunable filter (AOTF) based interferometer using double anisotropic acousto-optic Bragg diffraction. One embodiment uses a tunable laser as the light source while other embodiments use a broadband source or a fixed wavelength laser as the source. One embodiment uses anisotropic diffractions in an AOTF to generate two near-collinear orthogonal linear polarization and slightly displaced beams that both pass via a test sample to deliver highly sensitive sample birefringence or material optical retardation measurements. A spherical lens is used to form focused spots for high resolution spatial sampling of the test object. The laser and AOTF tuning allows birefringence measurements taken at different wavelengths, one at a time. An alternate embodiment makes use of anisotropic diffractions in an acousto-optic deflector or Bragg cell instead of the wavelength tunable AOTF. The instrument also forms a classic interferometric confocal microscope via the use of single mode fiber optics or spatial filter pin-hole with a point photo-detector for the receive light. An alternate embodiment via a transmissive beam generation design provides collinear co-located beams on the sample plane for super-accurate measurements.
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Agha Riza Nabeel
Bokhari Amana
Perez Frank
Beusse James H.
Beusse Wolter Sanks Mora & Maire, P.A.
Lyons Michael A.
Nuonics, Inc.
Toetley, Jr. Gregory J.
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