Scanning-probe techniques or apparatus; applications of scanning – Particular type of scanning probe microscopy or microscope;... – Atomic force microscopy or apparatus therefor – e.g. – afm probes
Reexamination Certificate
2011-06-07
2011-06-07
Noland, Thomas P (Department: 2856)
Scanning-probe techniques or apparatus; applications of scanning
Particular type of scanning probe microscopy or microscope;...
Atomic force microscopy or apparatus therefor, e.g., afm probes
C073S081000, C850S001000, C850S005000, C850S041000, C850S062000
Reexamination Certificate
active
07958566
ABSTRACT:
Disclosed is an atomic force microscope (AFM) probe for use in an AFM, and more particularly, an AFM probe suitable for testing the topography and mechanical properties of a microstructure having a size on the order of micrometers or nanometers. To this end, an AFM probe according to the present invention comprises an elastically deformable frame having a fixed end and a movable end on one axis; an AFM tip supported by the movable end to be movable against a test sample in a direction of the axis; and a stopper provided on an inner surface of the frame to control a movement of the AFM tip within a predetermined range.
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Search Report issued May 29, 2008 in corresponding European patent application No. 07150356.9 in 6 pages.
Choi Byung Ik
Han Seung Woo
Hyun Seung Min
Kim Jae Hyun
Kim Jung Yup
Knobbe Martens Olson & Bear LLP
Korea Institute of Machinery & Materials
Noland Thomas P
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