AFM for simultaneous recognition of multiple factors

Details AFM for simultaneous recognition of multiple factors AFM for simultaneous recognition of multiple factors

2008-01-29

2010-06-29

Yu, Melanie (Department: 1641)

Chemistry: molecular biology and microbiology

Apparatus

Including measuring or testing

C435S007100, C435S283100, C435S287100, C436S518000, C436S524000, C422S050000, C422S068100, C850S005000, C850S033000

Reexamination Certificate

active

07745206

ABSTRACT:
An atomic force microscope and a method for detecting interactions between a probe and two or more sensed agents on a scanned surface and determining the relative location of two or more sensed agents is provided. The microscope has a scanning probe with a tip that is sensitive to two or more sensed agents on said scanned surface; two or more sensing agents tethered to the tip of the probe; and a device for recording the displacement of said probe tip as a function of time, topographic images, and the spatial location of interactions between said probe and the two or more sensed agents on said surface.

REFERENCES:
patent: 5958701 (1999-09-01), Green et al.
patent: 6189374 (2001-02-01), Adderton et al.
patent: 2004/0129064 (2004-07-01), Hinterdorfer et al.
patent: 2007/0128623 (2007-06-01), Park et al.

Affiliated with

Also associated with

Rating

AFM for simultaneous recognition of multiple factors does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with AFM for simultaneous recognition of multiple factors, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and AFM for simultaneous recognition of multiple factors will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4189333