Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate
2002-03-19
2008-10-28
Noland, Thomas P (Department: 2856)
Measuring and testing
Surface and cutting edge testing
Roughness
C216S002000, C250S492100, C438S052000
Reexamination Certificate
active
07441444
ABSTRACT:
The invention provides high performance cantilevers with optimal combinations of high resonant frequency and low force constant. In one aspect, AFM cantilevers with spring constants in the range 1-10−6N/m with (fundamental) resonant frequencies in aqueous solutions of 0.1-100 MHz are provided. A high performance cantilever may be made by focused ion beam milling or electron deposition. The high performance cantilevers allow faster scanning, increase the temporal resolution of force measurement, improve measurement sensitivity by reducing cantilever noise, and improve sensitivity by reducing cantilever spring constant.
REFERENCES:
patent: 3327270 (1967-06-01), Garrison
patent: 5620854 (1997-04-01), Holzrichter et al.
patent: 5666190 (1997-09-01), Quate et al.
patent: 5874668 (1999-02-01), Xu et al.
patent: 5898106 (1999-04-01), Babcock et al.
patent: 5965218 (1999-10-01), Bothra et al.
patent: 6016693 (2000-01-01), Viani et al.
patent: 6017618 (2000-01-01), Gupta et al.
patent: 6087120 (2000-07-01), Van Oeveren et al.
patent: 6163519 (2000-12-01), Kuroda et al.
patent: 6203983 (2001-03-01), Quate et al.
patent: 6236589 (2001-05-01), Gupta et al.
patent: 6280939 (2001-08-01), Allen
patent: 6287765 (2001-09-01), Cubicciotti
patent: 6337479 (2002-01-01), Kley
patent: 2002/0062684 (2002-05-01), Adderton et al.
patent: 2006/0213289 (2006-09-01), Kjoller et al.
patent: 198 22 634 (1999-11-01), None
Akama, et al., “New scanning tunneling microscopy tip for measuring surface topography”, J. Vac. Sci. Technol. A, vol. 8, No. 1, pp. 429-433, Jan./Feb. 1990.
Butt, et al., “Calculation of thermal noise in atomic force microscopy”, Nanotechnology, vol. 6, pp. 1-7, 1995.
Butt, “Measuring electrostatic, van der Waals, and hydration forces in electrolyte solutions with an atomic force microscope”, Biophysical Journal, vol. 60, pp. 1438-1444, Dec. 1991.
Butt, et al., “Scan speed limit in atomic force microscopy”, Journal of Microscopy, vol. 169, pp. 75-84, Jan. 1993.
Hansma, et al., “Biomolecular Imaging with the Atomic Force Microscope1”, Annu. Rev. Biophys. Biomol. Struct., vol. 23, pp. 115-139, 1994, month not given.
Engel, et al., “Atomic force microscopy: a powerful tool to observe biomolecules at work”, Cell Biology, vol. 9, pp. 77-80, Feb. 1999.
Heinz, et al., “Spatially resolved force spectroscopy of biological surfaces using the atomic force microscope”, Elsevier Science, vol. 17, pp. 143-150, Apr. 1999.
Bustamante, et al., “Scanning force microscopy under aqueous solutions”, ???? Vol. “”, pp. 709-716, ??, by Mar. 2004.
Radmacher, et al., “Measuring the Viscoelastic Properties of Human Platelets with the Atomic Force Microscope”, Biophysical Journal, vol. 70, pp. 556-567, Jan. 1996.
Ebbesen, et al., “Large-scale synthesis of carbon nanotubes”, Nature, vol. 358, pp. 220-222, Jul. 1992.
Rief, et al., “Single Molecule Force Spectroscopy on Polysaccharides by Atomic Force Microscopy”, Science, vol. 275, pp. 1295-1297, Feb. 1997.
Lee, et al., “Direct Measurement of the Forces Between Complementary Strands of DNA”, Science, vol. 266, pp. 771-773, Nov. 1994.
Rugar, et al., “Force Detection of Nuclear Magnetic Resonance”, Science, vol. 264, pp. 1560-1563, Jun. 1994.
Vinckier, et al., “Measuring elasticity of biological materials by atomic force microscopy”, FEBS Letters, vol. 430, pp. 12-16, after Apr. 1998.
Czajkowsky, et al., “Submolecular resolution of single macromolecules with atomic force microscopy”, FEBS Letters, vol. 430, pp. 51-54, after Mar. 1998.
A-Hassan, et al., “Relative Microelastic Mapping of Living Cells by Atomic Force Microscopy”, Biophysical Journal, vol. 74, pp. 1564-1578, Mar. 1998.
Cappella, et al., “Force-distance curves by atomic force microscopy”, Surface Science Reports, vol. 34, pp. 1-104, 1999, month not given.
Gibson, et al., “Determination of the spring constants of probes for force microscopy/spectroscopy”, Nanotechnology, vol. 7, pp. 259-262, 1996, month not given.
Heinz, et al., “Reconstructing Local Interaction Potentials from Perturbations to the Thermally Driven Motion of an Atomic Force Microscope Cantilever”, J. Phys. Chem. B., vol. 104, pp. 622-626, 2000, (published on web Dec. 1999).
Hutter, et al., “Calibration of atomic-force microscope tips”, Rev. Sci. Instrum., vol. 64 (7), pp. 1868-1873, Jul. 1993.
Ried, et al., “6-MHz 2-N/m Piezoresistive Atomic-Force-Microscope Cantilevers with Incisive Tips”, Journal of Microelectromechanical Systems, vol. 6, No. 4, pp. 294-302, Dec. 1997.
Sader, “Parallel beam approximation for V-shaped atomic force microscope cantilevers”, Rev. Sci. Instrum., vol. 66, No. 9, pp. 4583-4587, Sep. 1995.
Sader, “Frequency response of cantilever beams immersed in viscous fluids with applications to the atomic force microscope”, Journal of Applied Physics, vol. 84, No. 1, pp. 64-76, Jul. 1998.
Schäffer, et al., “Characterization and optimization of the detection sensitivity of an atomic force microscope for small cantilevers”, Journal of Applied Physics, vol. 84, No. 9, pp. 4661-4666, Nov. 1998.
Stowe, et al., “Attonewton force detection using ultrathin silicon cantilevers”, Appl. Phys. Lett., vol. 71 (2), pp. 288-290, Jul. 1997.
Viani, et al., “Fast imaging and fast force spectroscopy of single biopolymers with a new atomic force microscope designed for small cantilevers”, Review of Scientific Instruments, vol. 70, No. 11, pp. 4300-4303, Nov. 1999.
Walters, et al., “Short cantilevers for atomic force microscopy”, Rev. Sci. Instrum., vol. 67 (10), pp. 3583-3590, Oct. 1996.
Antonik et al., “IEEE Eng. in Med. and Biol.”, vol. 16, No. 2, pp. 66-72 (Mar./Apr. 1997) “A Browser Based on Micromechanical Interrogation of Living Cells”.
Dai et al., “Nature”, vol. 384, pp. 147-150 (Nov. 1996), “Nanotubes as nanoprobes in scanning probe microscopy”.
Corless Peter F.
Edwards Angell Palmer & & Dodge LLP
Noland Thomas P
Sparks Jonathan M.
The Johns Hopkins University
LandOfFree
AFM cantilevers and methods for making and using same does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with AFM cantilevers and methods for making and using same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and AFM cantilevers and methods for making and using same will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4000896