Optics: measuring and testing – With sample preparation
Patent
1977-08-02
1980-05-06
McGraw, Vincent P.
Optics: measuring and testing
With sample preparation
356312, G01N 100, G01J 330
Patent
active
042014697
ABSTRACT:
A novel approach to sample deposition in furnace atomization is disclosed which obviates the need for skilled application of microvolumes by syringe. By means of the apparatus and method disclosed, the analyte in aerosol form is deposited under controlled conditions on the internal surface areas of graphite furnaces. Precision approaching that of flame atomization systems is achieved and at the same time, concentrational sensitivity may be increased simply by extending the deposition time. The amount of analyte deposited in the furnace is restricted only by the sample volume available and the matrix concentration. A single standard can be used to construct a calibration curve by simply varying the aerosol deposition time.
REFERENCES:
patent: 3736059 (1973-05-01), Schuhknecht et al.
patent: 3788752 (1974-01-01), Slavin et al.
patent: 3893769 (1975-07-01), Woolley
"Continuous Sample Introduction with Ghathite Atomization Systems for Atomic Absorption Spectrometry," Kantor et al., Analytical Chemistry, vol. 46, #14, pp. 2205-2213, Dec. 1974.
Matousek Jaroslav P.
Smythe Lloyd E.
McGraw Vincent P.
Unisearch Limited
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